When we talk about artificial intelligence, don't images of star models like DeepSeek come to mind? They can not only chat intelligently and write articles automatically, but also help us program efficiently. And when it comes to industrial production, we often focus on quality management tools like control charts and process capability analysis. General-purpose AI models (represented by DeepSeek, ChatGPT, Gemini, etc.) represent the cutting edge of intelligent technology in the information age, while Statistical Process Control (SPC) embodies the spirit of continuous improvement in product quality from the industrial era. Many people wonder how large models can replace SPC. Today, let's discuss what general-purpose AI models (especially models like DeepSeek) and SPC are all about. More importantly, let's explore whether we can leverage the "superpowers" of DeepSeek and other large models to upgrade traditional SPC analysis and usher in a new era of intelligent quality management!
First, we need to clarify the essence and respective focuses of general-purpose AI models and SPC. Although both are important tools and methodologies, they have significant differences in application areas and core functions. Understanding their fundamental differences and potential connections will greatly help us apply them better in practical work.
With the rapid update and iteration of Simple SPC, we released Simple SPC 2.0 today. Let’s take a look at what features we have updated in 2.0!
In the SPC system, you can configure the appKey and alarm user group of WeChat and DingTalk, and push them directly to WeChat and DingTalk. The following figure shows the actual effect of the push.


When the factor of the independent variable contains multiple levels, the statistical method of testing whether the averages of each level are equal, we have integrated the variance analysis function into the SPC analysis report, making it easier for everyone to do variance analysis.
As shown below:

Through something like http://xxx.com/access_token=xxxxxxxxxxm, any page of our SPC can be directly embedded through iframe. The actual effect is as follows

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The operating environment has been upgraded to the latest version of Python 3.12. At the same time, some major libraries such as sqlalchemy and pandas have also been upgraded to the latest version. During the upgrade process, some codes have been optimized, which has comprehensively improved the performance of the product.


We are serious about SPC and we are constantly innovating.
Our philosophy: extreme innovation, committed to making the best SPC products in China, and helping the quality of domestic manufacturing grow together.
In the realm of quality management, CPK (Process Capability Index) and PPK (Process Performance Index) are common interview questions and indispensable statistical indicators for quality professionals. They seem simple, yet often lead to confusion and debate.

CPK: Process Capability Index, reflects the capability of a process under controlled conditions, typically used to measure short-term process capability. PPK: Process Performance Index, reflects the actual performance of a process, typically used to measure long-term process capability. The calculation formulas for both are similar, but the estimation method for σ (standard deviation) differs: CPK: Uses within-subgroup standard deviation to estimate σ; the calculation method for within-subgroup standard deviation varies for different data types. PPK: Considers overall variation and uses overall standard deviation to estimate σ. CPK might overestimate process capability, while PPK is closer to the true capability.
CPK Calculation: Based on control charts (x̄-R chart or x̄-s chart), σ is calculated using the average range (R-bar) divided by d2, or the average sample standard deviation (S-bar) divided by c4. PPK Calculation: Includes all data within the control chart in the calculation, σ is calculated directly using the STDEV() function in Excel. Cpk reflects within-subgroup variation (short-term fluctuation), while Ppk includes both short-term within-subgroup variation and long-term between-subgroup variation, representing the overall quality indicator of the entire production process. In practical applications, some advocate using Ppk for control during new product trial production and switching to Cpk for control after mass production stabilizes. This is because the quality fluctuation is large during the trial production stage, and Cpk might not be effective for control; only Ppk can provide an understanding of the overall quality.
However, some people question the value of CPK and PPK. Some believe that Ppk has limited practicality because calculating overall quality means the product has already been produced, and it's impossible to prevent defective products in real-time. Moreover, the data might not come from actual measurements but rather be "fabricated." CPK and PPK seem to have become a "numbers game." Furthermore, there's also debate about whether CPK and PPK represent short-term or long-term capability. Some point out that short-term/long-term capability has nothing to do with CPK/PPK but is solely related to sampling. Short sampling time means short-term capability, and vice versa.
CPK and PPK, as important process capability indicators, play a significant role in quality management. However, we should also recognize their limitations and not blindly pursue indicators while neglecting the control and improvement of the actual process. Sampling plays a crucial role in quality management. The sampling method and sample size will both affect the assessment of process capability. Therefore, when using CPK and PPK, we need to pay attention to the rationality and representativeness of sampling.
CPK, PPK, and sampling are all very important tools in quality management. We need to deeply understand their connotations and limitations and apply them flexibly to truly realize their value and achieve effective quality control.
In Statistical Process Control (SPC), specification limits and control limits are two core concepts. Although they both play important roles in quality management and process monitoring, they differ in their definitions, sources, and applications. This article will explain these two concepts in detail and mainly discuss their potential to be one-sided or two-sided, as well as their impact on SPC metrics.

Specification limits are the acceptable range of product or process characteristics specified by customers, design specifications, or industry standards. They define the quality requirements that a product or service must meet. Specification limits typically include the Upper Specification Limit (USL) and Lower Specification Limit (LSL), used to assess whether the product meets the expected quality standards. If product characteristics exceed the specification limits, they are considered nonconforming.
Specification limits can be one-sided or two-sided:
Control limits are derived from the statistical analysis of process data and are used to monitor process stability. Control limits typically consist of the Upper Control Limit (UCL) and Lower Control Limit (LCL), reflecting the natural variation range of most data points in a process under normal conditions (normal distribution).
Control limits are usually two-sided because their primary function is to detect process stability and abnormalities. The calculation of control limits is typically based on the 6σ principle under a normal distribution, where data points within the 3σ range are considered normal process variations, and data points beyond this range are considered abnormal signals (under a normal distribution, the probability of exceeding the control limits is less than 1%).
Regardless of whether the specification limits are one-sided or two-sided, control limits are used to determine process stability and should include both upper and lower control limits to assess stability.
For example, even if the specification limit only requires the characteristic value to be greater than a minimum value (e.g., greater than 100), control limits will still be calculated based on the data (e.g., UCL = 200, LCL = 50):
The role of UCL and LCL: The Upper Control Limit (UCL) and Lower Control Limit (LCL) are used to detect abnormalities in the process. If process data points exceed these control limits, it indicates potential process anomalies that require further investigation. Even if a data point greater than 200 is acceptable based on the specification limit (as long as it is greater than 100), it may indicate process instability according to the control limit (UCL = 200), prompting further investigation into the cause of this anomaly.
Abnormality and Stability: Even if the process characteristics meet the specification limits, significant process variation (e.g., data points exceeding UCL or LCL) may indicate process instability. Control limits help identify this potential instability.
If the specification limit is one-sided (e.g., only LSL), control limits will still be two-sided. Exceeding the control limits will still trigger alarms, but data points exceeding LCL should receive particular attention, while data points exceeding UCL can be analyzed or ignored as needed.
When the specification limit is one-sided, it affects certain SPC metrics, especially those related to capability indices such as Ca, Ppk, and Cpk.
Ca (Capability Index) measures the degree of deviation between the process mean and the specification center. For one-sided specification limits, Ca cannot be calculated due to the lack of a reference center value.
Ppk and Cpk measure process performance and capability. For one-sided specification limits, Ppk and Cpk calculations only consider the direction of the existing specification limit. For example:
In these cases, one-sided specification limits only assess process capability in one direction, potentially leading to an incomplete evaluation of the process. Particularly with one-sided specification limits, it is essential to use two-sided control limits to monitor process stability comprehensively.
You may have noticed that when using Minitab to create Xbar-R and Xbar-S control charts, each is composed of a pair of charts:


This article provides the most detailed explanation available on the internet.
To clarify, the Xbar Control Charts in the Xbar-R and Xbar-S Control Charts are not the same. The use of Xbar-R Control Chart and Xbar-S Control Chart is conditional; we should not use Xbar-R and Xbar-S simultaneously on the same set of inspection data. Therefore, we do not need to worry about whether the Xbar Control Charts in Xbar-R and Xbar-S are the same, because we will not be using Xbar-R and Xbar-S at the same time.
we need to use the Xbar-R Control Chart. The control limits for the Xbar Control Chart and R Control Chart are calculated as follows:

we need to use the Xbar-S Control Chart. The control limits for the Xbar Control Chart and S Control Chart are calculated as follows:

The SPC constants such as A2, D4, A3, B4, etc., used in these formulas are as follows:
